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Comments? E-mail your comments about Synopsys documentation to [email protected] TetraMAX®. ATPG User Guide. Version , May 17 Dec Fault Simulation (TetraMAX). □ Lab time products before they are shipped to users. ▫ The number of bad products TetraMax user guide. 28 May TetraMAX ATPG – Datasheet TetraMAX ATPG Automatic Test Pattern Generation Overview TetraMAX® ATPG automatically generates high.

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Changing a V capacitor in Cisco switch power adapter TetraMAX II is built on new test generation, fault simulation and diagnosis engines that are uwer fast. The reuse of design modeling and rule checking infrastructure, as well as user and tool interfaces, ensures designers can quickly giude TetraMAX II risk-free on their most challenging designs.

The solution is capable of executing fine-grained multi-threading of the ATPG and diagnosis processes. The test solution delivers tight integration across the Synopsys Galaxy Design Platform, including Design Compiler, IC Compiler II place and route tool, and PrimeTime timing signoff, to enable faster turnaround time while meeting both design and test goals, higher defect coverage and faster yield ramp.

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latest version of tetraMax user guide

These innovations lead to significantly fewer test patterns and cut ATPG time from days to hours. Who Has the latest version of ParFil Version 4. Consider reading this before posting: Originally Posted by airqqy. FvM 15KlausST 8barry 8ads-ee 7betwixt 6. Similar Threads Does anyone have latest user guide for synopsys power compiler V. Please don’t make requests for help in private using PM. Initial value depending on the input 8. EFY was launched in giide, and is counted amongst the leading publications in the fields of electronics and technology—across the globe.

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These also feature exceedingly memory efficiency and high optimization for generating patterns.

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Friday, November 9, Additionally, TetraMAX II generates 25 percent fewer patterns, allowing IC design teams to shorten the time and lower the cost of testing silicon parts or, if required by specific market segments such as automotive, increase the quality of test without impacting test cost. Initial and final energy stored in a capacitor Reuse of production-proven ATPG interfaces ensures risk-free, easy deployment into design and test flows. Please enter your name here. This ensures that patterns are ready when early silicon samples are first available for testing.


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Tetramax User Guide

For automotive IC applications, TetraMAX II provides the opportunity to increase test quality with multiple fault models, without significant impact to test costs and test generation time.

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Part and Inventory Search. Quiery regarding cadence Fuse Amperage Determination Circuit This includes Yield Explorer yield management and Verdi debug tools, to deliver quality test and productive flows.

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